NOM's current product portfolio includes a non-contact profilometer for measuring forms and roughness of different surfaces at nm scale precision, 100mm field of view and built-in vibration resistance algorithm. Additionally, it enables to measure thickness of different films and flat parallel glass plates.
1nm - 100mm
Yes, up to 1m
0.05 - 100mm
Up to 50um/sec
*Selectivity along the line of the sight means that the Profilometer can measure optical distances between optical surfaces which situated behind other optical elements. This feature is illustrated on the figure below. The Profilometer can measure arbitrary optical surface on the right of the figure relatively to any other optical surface. Examples of such surfaces are shown on the figure by red lines. In this case distribution of optical thickness of the optical element is measured.